VSC6250QW-05

Product Summary

The VSC6250QW-05 1Gb/s 16-Channel Drive-Side Deskew IC is intended for use in the next generation of high-speed, high-accuracy memory testers for devices such as Direct RAMBUS DRAM, SLDRAM, DDR SDRAM, and fast SSRAM. The VSC6250QW-05 provides ultra-precise timing to allow next generation memory testers to achieve excellent overall timing accuracy. Timing delays of the VSC6250QW-05 are extremely stable with respect to temperature and voltage. Proprietary circuit design and process technology reduce pattern, data, frequency, and duty-cycle dependencies to an absolute minimum. The VSC6250 requires no external DACs, which eliminates errors due to DAC reference noise and analog crosstalk, and DAC temperature and voltage drift. The VSC6250QW-05 is available in a 128-pin PQFP, 14x20mm thermally-enhanced package. The VSC6250QW-05 is used in: (1)Drive-Side Deskew in High-Speed Memory Testers; (2)Direct RAMBUS DRAM, SLDRAM, DDR SDRAM, Fast SSRAM; (3)High-Speed Instrumentation: Pulse Generators, Timing Margin Testers for Datalink, Interface, and Disk Drive Applications; (4)Telecom, Datacom, and Computer Deskew.

Parametrics

VSC6250QW-05 absolute maximum ratings: (1)Power Supply Voltage (VTT): -2.5V to +0.5V; (2)ECL Input Voltage Applied, (VIN ECL)): +0.5V to VTT + -0.5V; (3)Output Current (IOUT) ): 50mA; (4)Case Temperature Under Bias (TC)): -55℃ to + 125℃; (5)Storage Temperature (TSTG)): -65℃ to + 150℃.

Features

VSC6250QW-05 features: (1)High-Speed Operation; (2)Excellent Overall Timing Accuracy; (3)High Level of Integration Reduces Board Area: 16 Independently Adjustable Delay Lines in a Single Package; (4)Configurable as 2 1:8 or 1:16; (5)Wide Span: > 4ns Usable Range; (6)Pulse Width Adjustment to Compensate for Dispersion in Pin Electronics; (7)2ns Independent Adjustment of Rising and; (8)Falling Edges; (9)Fully Digital Single-Chip Solution; (10)Single Power Supply: -2V @ 5W; (11)128-Pin PQFP, 14x20mm Thermally-Enhanced Package.

Diagrams